| Dear colleagues,
The deadline of the forthcoming SPIE conference
"Optical Measurement Systems for Industrial Inspection IV"
to be held in Munich from the 13th to the 16th June 2005 as part of the SPIE Symposium on Optical Metrology will be approached very soon!
Abstracts for this conference are due by
20 December 2004.
Therefore we want to draw your attention again to this conference and to encourage you, your colleagues and coworkers to take part as an active member of the community.
Submit your abstract.